Recently the question arised, how the physical properties of a ferroelectric change when the grain size is reduced to the nanometer range. We have produced amorphous Lead Calcium Titanate (PTC) films by rf-sputtering onto Pt/Ti/Si substrates. We then prepared different grain sizes by two different types of annealing processes. To investigate the dielectric properties the temperature and frequency dependence of the dielectric constant was recorded and temperature dependent Raman spectroscopy was used to look for phase transitions and symmetries. Independent of the annealing method all nanocn stalline samples showed a significant diffusivity of the phase transition. The dielectric properties also changed from classical ferroelectric to relaxor behaviour with a large frequency dependence of the dielectric constant.
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Ziebert et al. (2000) studied this question.
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