Polarization sensitive behaviour of the band-edge transitions in ReS2and ReSe2layered semiconductors

The polarization sensitive behaviour of the band-edge transitions in ReS 2 and ReSe 2 layered compounds was studied using polarized-transmission and polarized-thermoreflectance (PTR) measurements with polarization angles from θ = 0° ( -axis) to θ = 90° ( -axis) at 300 K. The polarization dependence of the polarized energy gaps of ReS 2 and ReSe 2 shows a sinusoidal-like variation with respect to the angular change of the linearly polarized light. The angular dependences of the polarized energy gaps of ReS 2 and ReSe 2 were evaluated. The polarization sensitive behaviour of the band-edge excitons in rhenium disulfide and diselenide was characterized using angular dependent PTR measurements from θ = 0° to 90°. The polarized transition intensities of the band-edge excitons ( E 1 ex and E 2 ex ) of ReX 2 (X = S, Se) demonstrate a sinusoidal variation with respect to the angular change of the linearly polarized light. The angular dependence of the polarized transition probabilities of E 1 ex and E 2 ex is analysed. The polarization sensitive behaviours of ReX 2 (X = S, Se) layers are discussed.