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Recent developments have allowed x-ray diffraction techniques at synchrotron radiation facilities to be employed with a temporal resolution of around 1 ps. These developments are the availability of firstly, high brightness third-generation x-ray sources, secondly, passively mode-locked lasers with 100 fs temporal duration and thirdly, averaging streak cameras with sub-picosecond temporal resolution. In this paper, we discuss how these novel devices are combined in time-resolved x-ray diffraction experiments at synchrotron radiation facilities.
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Jörgen Larsson (2001) studied this question.
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