Transmission electron microscopy excels at determining a sample's physical structure---the locations and identities of its constituent atoms---, but is typically blind to electronic structure. A combination of electron-beam-induced current (EBIC) imaging with scanning transmission electron microscopy (STEM), however, does reveal electronic properties by detecting the emission of both secondary electrons and the corresponding holes, for differential contrast that is otherwise inaccessible. Thus STEM EBIC can provide high-resolution images of the properties that govern the function of nanoelectronic devices.
No takes yet. Share an insight, caveat, or question.
Hubbard et al. (2018) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: