Time delays of electrical breakdown in a gas-filled diode (t d ) were measured as a function of the time between two successive measurements ( tau ) at cathode temperatures of 300K, 523K and 673K. The diode was filled with nitrogen at 4 mbar with an oxygen impurity of about 10 ppm. It is shown that the breakdown time delays at 673K are one order of magnitude smaller than those at 300K.
No takes yet. Share an insight, caveat, or question.
Bosan et al. (1979) studied this question.
Synapse has enriched 2 closely related papers on similar clinical questions. Consider them for comparative context: