Photoreflectance line shapes of various semiconductor microstructures were discussed in this paper. Formulas suitable for application in low-dimensional structures were given and used to analyze experimental results from various semiconductor microstructures including GaAs nipi structures, GaAs/AlGaAs multiple quantum wells, InGaAs/GaAs strained-layer superlattices, and
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Y. S. Tang (1991) studied this question.
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