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The surface electronic structure of tetrathiafulvalene-tetracyanoquinodimethane (TTF-TCNQ) has been studied by x-ray photoemission spectroscopy (XPS) for evaporated films prepared under sundry conditions. Sample stoichiometry and the relative number of neutral molecules on the surface can be varied over a considerable range. We conclude that neither the degree of bulk charge transfer nor charge delocalization can be determined from XPS line shapes contrary to previous assertions. Also, there is no evidence for an intrinsic neutral surface layer.
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Ritsko et al. (1978) studied this question.
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