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January 15, 1985Journal of Applied Physics

A mechanism for radiation-induced degradation in GaAs field-effect transistors

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Authors

FBF. A. BuotUniversity of San CarlosWAW.T. AndersonUnited States Naval Research LaboratoryACA. ChristouUniversity College London

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Buot et al. (1985) studied this question.

synapsesocial.com/papers/6a928655fa60aefc093ab0b4https://doi.org/10.1063/1.334741
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