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April 1, 1957Review of Scientific Instruments

Improved Method to Measure the Thickness of Thin Films with a Photoelectric Ellipsometer

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ARAlexandre RothenRockefeller University

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Alexandre Rothen (1957) studied this question.

synapsesocial.com/papers/6a92ceeb84954b97993ab8d3https://doi.org/10.1063/1.1715860
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Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Optical Measurements of Surface Films. I1948 · 23 citations
  2. 2The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface Films1945 · 245 citations
  3. 3Optical Properties of Surface Films. II1949 · 32 citations
  4. 4Studies of Surface Films by Reflection of Polarized Light. I. A More Rigorous Algebraic Method for Computing Results1948 · 20 citations
  5. 5Built-Up Films of Barium Stearate and Their Optical Properties1937 · 1,062 citations