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February 1, 1945Review of Scientific Instruments

The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface Films

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ARAlexandre RothenRockefeller University

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Alexandre Rothen (1945) studied this question.

synapsesocial.com/papers/6a92cf6c6a4f73282e184dbfhttps://doi.org/10.1063/1.1770315
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