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May 1, 2002Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

High reflectivity and crack-free AlGaN/AlN ultraviolet distributed Bragg reflectors

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Authors

ABAnirban BhattacharyyaUniversity of CalcuttaSISandeep IyerBoston UniversityEIE. IliopoulosUniversity of Crete

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Bhattacharyya et al. (2002) studied this question.

synapsesocial.com/papers/6a92fb87b38bf6ce534a9fddhttps://doi.org/10.1116/1.1482070
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