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ADVERTISEMENT RETURN TO ISSUEPREVCommunicationNEXTInterferometric Study on the Adsorption-Dependent Refractive Index of Silicalite Thin Films Grown on Optical FibersJian Zhang, Ming Luo, Hai Xiao, and Junhang DongView Author Information Department of Chemical Engineering, Petroleum Recovery Research Center, and Department of Electrical Engineering, New Mexico Institute of Mining and Technology, Socorro, New Mexico 87801 Cite this: Chem. Mater. 2006, 18, 1, 4–6Publication Date (Web):December 13, 2005Publication History Received17 November 2005Published online13 December 2005Published inissue 1 January 2006https://doi.org/10.1021/cm0525353Copyright © 2006 American Chemical SocietyRIGHTS & PERMISSIONSArticle Views416Altmetric-Citations27LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstract
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Zhang et al. (2005) studied this question.
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