We report room-temperature high-field (E≳106 V/cm) electrical conduction measurements in ’’flaw-free’’ thin Ta2O5 films (140–2400 Å), with gold and aluminum counterelectrodes. The experimental results rule out electrode-limited conduction even though dlogi/dV1/2 corresponds to the Schottky process.
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Peter L. Young (1975) studied this question.
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