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An expression is derived for the resolution correction based on the measured incident beam profile in the detector plane. The results are valid for any experimental configuration. Comparison is made with earlier treatments of this correction. The result given here will permit more accurate analysis of total scattering cross section measurements. Sample calculations are described and applied to recent determinations of the He–He potential. Finally, an expression is obtained for the small-angle elastic differential cross section which can be used to deconvolute experimental measurements.
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Eric A. Gislason (1975) studied this question.
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