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September 14, 1998Applied Physics Letters

Enhanced sensitivity near-field scanning optical microscopy at high spatial resolution

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Authors

HHHendrik F. HamannStony Brook UniversityAGA. GallagherNational Institute of Standards and TechnologyDNDavid J. NesbittNational Institute of Standards and Technology

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Hamann et al. (1998) studied this question.

synapsesocial.com/papers/6a938f3173075f1cdcafcd23https://doi.org/10.1063/1.122176
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