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A review of the application of the Monte Carlo, fundamental parameters method to XRF fluorescence analysis for the reduction of matrix effects is made. The analytical solutions arising from theoretical equations are given along with the restrictive assumptions that are necessary to this approach. The extensions of the fundamental parameters method by the Monte Carlo simulation to practical situations that require much less restrictive assumptions are outlined. The average angle approach to the use of the analytical solutions is investigated by comparison with the Monte Carlo method. Future extensions of the fundamental parameters method by the Monte Carlo approach are discussed.
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Gardner et al. (1978) studied this question.
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