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April 1, 1974IEEE Transactions on Electron Devices

Measurements and interpretation of low-frequency noise in FET's

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MDM.B. DasPennsylvania State UniversityJMJ.M. MooreVibrant Data (United States)

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Das et al. (1974) studied this question.

synapsesocial.com/papers/6a93aa63c71ca0043637d2d9https://doi.org/10.1109/t-ed.1974.17906
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Also Consider

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  1. 1Characterization of low 1/f noise in MOS transistors1971 · 153 citations
  2. 2Theory of low-frequency generation noise in junction-gate field-effect transistors1964 · 116 citations
  3. 3FET noise sources and their effects on amplifier performance at low frequencies1972 · 22 citations
  4. 4Thermal noise in junction-gate field-effect transistors1966 · 46 citations
  5. 5Surface states and 1/f noise in MOS transistors1967 · 67 citations