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March 1, 1966IEEE Transactions on Electron Devices

Thermal noise in junction-gate field-effect transistors

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Authors

WBW.C. BrunckeTexas Instruments (United States)AZA. van der ZielNXP (Netherlands)

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Cite This Study

Bruncke et al. (1966) studied this question.

synapsesocial.com/papers/6a7dae5971280c8641cda8eahttps://doi.org/10.1109/t-ed.1966.15688
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