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January 1, 1963Proceedings of the IEEE

Gate noise in field effect transistors at moderately high frequencies

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AZA. van der ZielNXP (Netherlands)

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A. van der Ziel (1963) studied this question.

synapsesocial.com/papers/6a7c0970ae178dbf17c655behttps://doi.org/10.1109/proc.1963.1849
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