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The attenuation length l for photoelectrons excited in aluminum by 584-{} photons has been determined and found to lie in the range $4<~l<~12.8$ {}. The determination was made by analyzing the relative photoemissive yield as a function of angle. The method also provides an accurate means of obtaining the film thickness and index of refraction of aluminum from photoemission measurements alone.
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Gesell et al. (1971) studied this question.
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