A simplified method for aberration measurement in confocal microscopy is proposed. The method is based on analysis of the Fourier spectrum of the confocal interference axial response. With this method, both the complex pupil function and the complex defocus signal can be recovered from only a single measurement, and no electro-optic phase modulator is needed. This method has been demonstrated both theoretically and experimentally.
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Zhou et al. (1997) studied this question.
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