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Using Lorentz transmission electron microscopy, the micromagnetic structure was observed and the periodicity and angular spread of the in-plane magnetization were estimated for Fe-Zr-N films sputter-deposited on different substrates. The influence of the micromagnetic ripple on the ferromagnetic resonance width is analyzed using an approach based on the Landau-Lifshitz equation. A strong dependence of the resonance width on the magnetic moment dispersion is predicted. To a large extent, this particular aspect explains the high frequency response in some of our films.
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Chechenin et al. (2002) studied this question.
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