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May 1, 2000Journal of Applied Physics

Frequency- and time-resolved measurements of FeTaN films with longitudinal bias fields

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Authors

CACameron AlexanderUniversity of NottinghamJRJames RantschlerUniversity of HoustonTST. J. SilvaNational Institute of Standards and Technology

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Alexander et al. (2000) studied this question.

synapsesocial.com/papers/6a97e32a618eaafe842d395ahttps://doi.org/10.1063/1.372794
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