The effect of the 2Δ recombination phonons in modifying the effective lifetime τeff for quasiparticle recombination has been determined for the first time in a double-junction experiment by comparing measurements taken both with and without a helium film covering the junctions. For a double junction made from evaporated aluminum films 300 {} thick deposited on a glass substrate, we find τeffτR=8.6±1.1 in the absence of the helium film, and, at ΔkT=6, τR=1.4±0.1 {μ}sec.
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Smith et al. (1975) studied this question.
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