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The current-voltage characteristic of insulating films is usually regarded as being due to quantum-mechanical tunneling for very thin films, and as being space-charge-limited for thicker films. Using an electronic model of a dielectric which was first introduced to explain dielectric breakdown, the current-voltage characteristic is derived taking explicit account of field emission from the cathode and space-charge buildup in the body of the dielectric. The characteristic is non-Ohmic and dependent on thickness and temperature.
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J. J. O’Dwyer (1966) studied this question.
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