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January 1, 1999IEEE Transactions on Electron Devices

A new look at impact ionization-Part II: Gain and noise in short avalanche photodiodes

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PYPeng YuanQingdao UniversityKAK.A. AnselmApplied Optoelectronics (United States)CHChang‐Ping HuFu Jen Catholic University

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Yuan et al. (1999) studied this question.

synapsesocial.com/papers/6a94265101cbad7102007ee8https://doi.org/10.1109/16.777151
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