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January 1, 1998IEEE Transactions on Electron Devices

Avalanche multiplication noise characteristics in thin GaAs p/sup +/-i-n/sup +/ diodes

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KLK.F. LiUniversity of SheffieldDODuu Sheng OngMultimedia UniversityJDJ.P.R. DavidUniversity of Sheffield

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Li et al. (1998) studied this question.

synapsesocial.com/papers/6a94265101cbad7102007eebhttps://doi.org/10.1109/16.725242
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