Study of Excess Noise Factor Under Nonlocal Effect in Avalanche Photodiodes

This is the authors' abstract. We don't add key points for this paper.

Avalanche photodiodes with thin multiplication regions exhibit a linear relationship between F(M) and M, which differs from the local-field model. This letter presents a study of the relationship between F(M) with M when nonlocal effects are significant. Systematic Monte Carlo simulations on different avalanche photodiodes have been carried out to support the analytical model.