Magnetization reversal and magnetic anisotropy in patterned Co/Pd multilayer thin films

( Co / Pd ) N multilayers exhibit high vertical magnetic anisotropy and have been extensively explored as recording medium candidates for high density magnetic recording applications. In this work, (Co/Pd)N multilayers are deposited by magnetron sputtering and patterned into large periodic arrays of 200 nm islands to enable controlled domain wall injection for quantitative comparison of magnetic anisotropy energies. Magnetic properties are correlated with x-ray photoelectron spectroscopy data, an approach commonly used to probe the binding energies and valence band positions. Confirming theoretical predictions, it is demonstrated that the degree of d-shell hybridization at Co/Pd interfaces directly correlated with the magnitude of magnetic anisotropy.