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A new waveform control algorithm for Rotational Single Sheet Testers (RSST) is presented. The new algorithm achieves circular magnetization for high induction levels even in samples of grain-oriented silicon steel sheets. The algorithm is based on the circuit model of the system and takes the coupling between the two phases of the RSST into account. Identification of the parameters of the measurement setup with the Least Squares (LS) method avoids preliminary measurements on the sample and the setup. The performance of the algorithm is illustrated by measurements on a grain-oriented sample. The algorithm is universally applicable and allows fully automated measurements.
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Makaveev et al. (2001) studied this question.
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