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A video imaging system utilizing a high sensitive image orthicon camera tube has been set up and applied to x-ray diffraction topography using the double-crystal arrangement of parallel setting. The system gives a video signal of S/N 20 dB for incident 3 × 104 x-ray photons sec−1 mm−2. The resolution of the system is 300 μ for 70% of the modulation transfer function, limited presently by the resolution of the x-ray phosphor. As an example, long-range elastic strains in an Sb-doped silicon crystal have been studied.
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Hashizume et al. (1971) studied this question.
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