A Single Hard Error (SHE) characterization was performed on two types of 1 Mbit SRAMs:MT5C1008 from MICRON and MSM8128 from HITACHI. On both types, test results showed that one single ion is sufficient to create a stuck bit. An orbit SHE rate calculation showed that the probability to have a stuck bit in space on a single 1 Mbit SRAM is rather low.>
No takes yet. Share an insight, caveat, or question.
Poivey et al. (1994) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: