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December 1, 1976IEEE Transactions on Nuclear Science

MOS Hardness Characterization and Its Dependence upon Some Process and Measurement Variables

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GHGary W. HughesUnited States Air Force Research LaboratoryRPRoy PowellNIHR Clinical Research Network

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Hughes et al. (1976) studied this question.

synapsesocial.com/papers/6a944fcdfde2ed39e1a0cb7dhttps://doi.org/10.1109/tns.1976.4328541
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