Two types of devices representative of very-largescale-integration, 64k dynamic RAMs and 68000 microprocessors, have been studied in a total dose ionizing radiation environment. Both types of parts show an improved hardness compared to earlier test results for large-scale-integrated dynamic RAMs and microprocessors. This indicates that the previously developed downward trend of radiation hardness versus circuit complexity may not continue to prevail.
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King et al. (1980) studied this question.
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