The polyethylene thin films on the mica (001) plane have been prepared by the ionized cluster beam deposition technique and analyzed by the transmission electron microscope. We have found that the polyethylene crystal lamellar structures are obviously affected by the crystal mica substrate. We have observed the Moire fringe pattern and the overlap diffraction spot array for both crystal thin films, as well as explained that the polyethylene subunit cell grows along, the direction which rotates 60° relative to the unit cell of the mica (001) plane.
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Xue et al. (1992) studied this question.