The energy distribution function of hot electrons emitted from a 13 nm SiO2 layer is measured through vacuum emission experiments up to 4 eV. The results evidence the presence of carriers in an energy region well above the ballistic threshold. A Monte Carlo simulation of carrier transport in the presence of non‐polar scattering and collisional broadening is in qualitative agreement with the experiments thus providing a value of 3.1 × 109 eV/cm for the deformation potential and a direct indication of collisional broadening effect in high‐field transport of electrons in SiO2.
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Reggiani et al. (1996) studied this question.
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