We present resonantly enhanced magneto-optical Faraday rotation data of linearly polarized soft x rays across the 2p absorption edges in Fe, Co, and Ni thin films using synchrotron radiation. Rotation angles of up to ±{}90^∘{} were measured. These values are more than one order of magnitude larger than so far observed. By linear polarization analysis the dependence of the Faraday rotation on layer thickness, angle of incidence, magnetic field strength, and photon energy was investigated. The dichroism of the dispersion and absorption parts of the refraction index is in agreement with magnetic circular dichroism absorption data of the same films with circularly polarized light.
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Mertins et al. (2000) studied this question.