We present a technique to measure directly the extent of surface scattering in giant magnetoresistance (GMR) spin valves. By monitoring both resistance and magnetoresistance during deposition, we may quantify any discontinuous changes in electron scattering associated with the formation of a given surface. Our technique is applied to the case of noble metal overlayer deposition (Ag and Cu) on NiO/Co/Cu/Co spin valves. We find no evidence to support the establishment of a specularly reflecting surface.
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Bailey et al. (1999) studied this question.
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