Surface Morphological Study of J-Aggregate Thin Films by Atomic Force Microscopy

ADVERTISEMENT RETURN TO ISSUEPREVNoteSurface Morphological Study of J-Aggregate Thin Films by Atomic Force MicroscopyLars Daehne, Jian Tao, and Guangzhao MaoView Author Information Institute of Physical Chemistry, Free University Berlin, Takustrasse 3, D-14195 Berlin, Germany Department of Chemical Engineering and Materials Science, Wayne State University, 5050 Anthony Wayne Drive, Detroit, Michigan 48202 Cite this: Langmuir 1998, 14, 2, 565–568Publication Date (Web):January 6, 1998Publication History Received17 July 1997Revised5 November 1997Published online6 January 1998Published inissue 1 January 1998https://pubs.acs.org/doi/10.1021/la9707989https://doi.org/10.1021/la9707989brief-reportACS PublicationsCopyright © 1998 American Chemical SocietyRequest reuse permissionsArticle Views156Altmetric-Citations27LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-Alertsclose SUBJECTS:Absorption,Crystal structure,Dyes and pigments,Layers,Thin films Get e-Alerts