Studies of the correlation lengths of sputtered CoCrTa(600Å)/Cr(1500Å) thin films deposited at different substrate temperatures were performed in the frequency domain. The along-track correlation length, q, is found to decrease from 3.1 μm to 1.3 μm when the substrate temperature is increased from room temperature to 220°C. The integrated reverse DC erase noise power decreases exponentially while q decreases. The decrease of q implies a decrease in the size of magnetic clusters in the reversal process and as a result the reverse DC erase noise decreases due to the refinement of the magnetic microstructure. The decrease of cluster size can be explained by the reduction of the intergranular exchange interaction suggested by δM measurements.
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Hsu et al. (1991) studied this question.
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