Experimental and theoretical results are given for the noise produced in thin-film media after reverse DC erasure. The noise spectra produced at high bit densities and at reverse DC erasure around the remanent coercivity look identical. A theoretical spectral model based on Poisson statistics shows a good fit with the measured noise spectra. A novel technique for measuring the medium noise in the spatial domain has been developed. The results obtained in the spatial domain through autocorrelation of the read flux agree well with the noise results obtained in the spectral domain.>
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Vos et al. (1990) studied this question.
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