January 1, 1983IEEE Transactions on Nuclear Science

Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data

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Abstract

A summary of the data on single event upset (bit flips) for sixt-y device types, having data storage elements, that were tested by JPL through May, 1982, is presented. The data were taken from fifteen accelerator tests with both protons and heavier ions.

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Nichols et al. (1983) studied this question.

synapsesocial.com/papers/6a946583fde2ed39e1a0d40b https://doi.org/10.1109/tns.1983.4333164

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Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data

Abstract

Discussion

Cite This Study

Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data

Abstract

Discussion

Cite This Study

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