The absolute magnetic moments of thin Cr overlayers on Fe(100) are directly determined by energy-resolved spin-polarized secondary-electron emission. Spin-dependent attenuation of low-energy secondary electrons is quantitatively treated, following a model by Siegmann, to extract magnetic depth profiles in the adlayer. The first monolayer of Cr couples antiferromagnetically to the Fe substrate and exhibits a maximum magnetic moment of 1.8±{}0.2μB per atom for a submonolayer coverage. Subsequent Cr layers show a positive magnetization. {} 1996 The American Physical Society.
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Fuchs et al. (1996) studied this question.
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