Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
July 3, 2000Physical Review Letters

Measurement of Internal Stresses via the Polarization in Epitaxial Ferroelectric Films

View Full Paper
Ask AI
Bookmark
Share

Authors

ARA. L. RoytburdNational Institute of Standards and TechnologySAS. P. AlpayNew Mexico State UniversityVNV. NagarajanVel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Roytburd et al. (2000) studied this question.

synapsesocial.com/papers/6a94e65a5f3b0bfa3be61480https://doi.org/10.1103/physrevlett.85.190
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Characterization of ferroelectric lead zirconate titanate films by scanning force microscopy1997 · 214 citations
  2. 2High resolution study of domain nucleation and growth during polarization switching in Pb(Zr,Ti)O3 ferroelectric thin film capacitors1999 · 148 citations
  3. 3Measurement of piezoelectric coefficients of ferroelectric thin films1994 · 599 citations
  4. 4Thermodynamics of polydomain heterostructures. I. Effect of macrostresses1998 · 150 citations
  5. 5Domain structure of multiaxial ferroelectric crystals1989 · 66 citations