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In this study, we first profiled model organic light‐emitting diodes (OLEDs) with the structure Ag/tris(8‐hydroxyquinoline) aluminium (Alq 3 )/ N , N ′‐diphenyl‐ N , N ′‐bis[1‐naphthyl‐(1,1′‐biphenyl]‐4,4′‐diamine (NPB)/indium tin oxide (ITO) using dynamic SIMS. The element distribution across the multilayer and the dynamic SIMS spectra at different regions were obtained. It was shown that dynamic SIMS is a powerful tool in profiling OLEDs. Clear diffusion of Ag into the Alq 3 layer was observed. The experimental results also revealed that a distinct interface for Alq 3 /NPB can be obtained using dynamic SIMS.
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Song et al. (2001) studied this question.
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