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The crystal structure of ZnS single crystals grown from melt has been found to be cubic zinc blende by the x-ray analysis of oscillation photographs. However, the x-ray 〈111〉 axis oscillation patterns of the crystals synthesized by various methods are symmetric about the equator line and some spots are elongated along c*, whereas the patterns of natural crystals are asymmetric and sharp. Therefore, it is concluded that the synthetic ZnS crystal contains a considerable amount of stacking disorder in the close-packed planes due to growth faults which result in two orientations in the crystal structure (twin orientations) that repeat with a relatively short periodicity. The value of fault probability occurring in the (111) plane can be obtained by superimposing the observed diffuse diffraction spectra with the ones calculated numerically by a formula proposed by Paterson for the growth fault. This value is also compared with that obtained from the transmission electron micrographs.
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Ebina et al. (1967) studied this question.
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