In many high resolution electron micrographs of oxides, minerals and other materials, planar faults, often nearly parallel to the electron beam, are visible. When the crystal structure is clearly resolved the nature of the faults may be evident from the images, as in the case of the faults in the periodicities of the block structures of niobium and niobium-titanium oxides (Iijima, 1973; Iijima, Kimura and Goto, 1973), the shear planes (Wadsley defects) occuring in reduced tungsten trioxide (Iijima, in preparation) and the micro-twins occuring in the mineral enstatite (Iijima and Buseck, in preparation).
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J. M. Cowley (1974) studied this question.
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