Time and frequency domains dc conductivity analysis in thin dielectric films at high temperature

Electrical conductivity of a thin dielectric film has been analysed at high temperature in both time and frequency domains (TD/FD). Two disturbing ionic space-charge phenomena have been highlighted in two different temperature ranges and a correlation of their electrical signature between TD and FD is carried out. These two phenomena were related to the thermal activation of ions coming from two different trap levels (shallow and deep traps). We validate here also the fact that the FD method is a powerful way to estimate the dc conductivity in dielectric solids at high temperature thanks to a better discrimination of ionic contributions and injection phenomena.