High quality nonpolar a ‐plane GaN templates were grown by utilizing sidewall lateral epitaxial overgrowth (SLEO) technique with threading dislocation density of ∼106–107 cm–2. 360 nm GaN/AlGaN multiple quantum well ultraviolet light emitting diodes were grown with metalorganic chemical vapor deposition. Reduced defect density SLEO a‐ plane, planar a ‐plane, and planar c ‐plane templates were co‐loaded for device growth and processed together in order to make relative device performance comparison. For SLEO a ‐plane LEDs E EL peak position was measured at 360 nm and it was independent of drive current. The linewidth of the emission was 7 nm. The series resistance of these diodes was as low as 16.5 Ω and the forward voltage was measured as 4.08 V at 20 mA. The external quantum efficiency of the high quality SLEO a ‐plane devices was ∼275× higher than planar a ‐plane devices. The highest output power was realized at 200 mA as 65 μW. The effect of contact geometry on electrical and optical characteristics of the devices was also discussed. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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Imer et al. (2008) studied this question.
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