160 Gbit/s error-free demultiplexing by ultrafast optical gate monolithically integrating photodiode and electroabsorption modulator

160 Gbit/s error-free demultiplexing operation of a novel ultrafast optical gate is reported, that monolithically integrates a uni-travelling-carrier photodiode and a travelling-wave electroabsorption modulator. An on/off ratio of 17 dB and a receiver sensitivity of −23.3 dBm at a bit error rate of 10−9 have been achieved.